Lamp & Neck & Particle Defect Detector
During production, defects such as concave and convex irregularities are often caused by issues with raw materials, processes, or equipment.
The LN series micro-wire particle defect detector uses advanced miniaturized optoelectronic components and high-speed analog signal processing technology, offering an innovative solution for non-contact detection of micron-level particle defects on surfaces. It is especially suitable for monitoring various process steps on high-speed production lines, including drawing, coating, sheathing, and coloring. The system can accurately detect and characterize a range of fine defects, such as bulges, necking, blisters, bubbles, coarse segments, scratches, particle contamination, coating delamination, and bruises.
The LN series micro-wire particle defect detector uses advanced miniaturized optoelectronic components and high-speed analog signal processing technology, offering an innovative solution for non-contact detection of micron-level particle defects on surfaces. It is especially suitable for monitoring various process steps on high-speed production lines, including drawing, coating, sheathing, and coloring. The system can accurately detect and characterize a range of fine defects, such as bulges, necking, blisters, bubbles, coarse segments, scratches, particle contamination, coating delamination, and bruises.
| Applicable Diameter Range | 0.015 mm - 0.8 mm |
| Applicable Line Speed | 5 - 1500 m/min |